Faster, More Accurate Defect Classification Using Machine Vision

November 14th, 2018 | Connected Social Media Syndication

IT Best Practices: Automated defect classification (ADC) using machine vision (MV) and machine learning (ML) can improve speed, consistency, and efficiency in manufacturing processes.

For more information on Intel IT Best Practices, please visit intel.com/IT

Tags: computer vision, defect classification, information technology, Intel, Intel IT, IT Best Practices, IT Business Value, IT Whitepaper, IT@Intel, machine learning, machine vision, pdf

Posted in: Intel, Intel IT, IT White Papers, IT@Intel

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Faster, More Accurate Defect Classification Using Machine Vision

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