Faster, More Accurate Defect Classification Using Machine Vision

November 14th, 2018 |
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Faster, More Accurate Defect Classification Using Machine Vision
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For more information on Intel IT Best Practices, please visit www.intel.com/IT
 

IT Best Practices: Automated defect classification (ADC) using machine vision (MV) and machine learning (ML) can improve speed, consistency, and efficiency in manufacturing processes.

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